Wavefront-based alignment is an elegant approach to high-precision positioning. The system status can be evaluated in one single measuring operation and suitable correction actions can be derived.
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Technical Articles
- 16.01.2017
Advanced microscopy techniques often require custom built systems or expensive additions to commercial microscopes. A novel device enhances any microscope without the need of further equipment.
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Technical Articles
- 16.01.2017
In many industries, LEDs are replacing broadband light sources. For efficient LED quality testing in the production process, new measurement techniques are needed.
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Technical Articles
- 16.01.2017
A spin-off of the Technische Universität Braunschweig has developed nano-scaled rulers as calibration and test tools for the microscopy market.
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Technical Articles
- 16.01.2017