Wavefront-based alignment is an elegant approach to high-precision positioning. The system status can be evaluated in one single measuring operation and suitable correction actions can be derived. mehr
Advanced microscopy techniques often require custom built systems or expensive additions to commercial microscopes. A novel device enhances any microscope without the need of further equipment. mehr
In many industries, LEDs are replacing broadband light sources. For efficient LED quality testing in the production process, new measurement techniques are needed. mehr
A spin-off of the Technische Universität Braunschweig has developed nano-scaled rulers as calibration and test tools for the microscopy market. mehr