Optical Metrology

Photoluminescence imaging applications in silicon photovoltaics

17.11.2011 - Photonik international /2011 |  [ deutsche Version lesen ]

Photoluminescence imaging of large-area silicon wafers was demonstrated at the University of New South Wales, Sydney, in 2005, and since then, the technique has proven to be a versatile, contactless method for measuring a range of important material and device parameters. It offers an unprecedented combination of short measurement time and high spatial resolution. Within only a few years, this measurement technique has been adopted rapidly as an efficient tool for research and development.

Photonik I/2011
Authors: Thorsten Trupke, BT Imaging Pty Ltd. and University of New South Wales, Sydney, Australia

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