Optical Metrology

White-light interferometry for quality assurance

12.03.2009 - Photonik international 1/2009 |  [ deutsche Version lesen ]

Quality assurance requirements in the production process are becoming more and more stringent. Optical metrology – including white-light interferometry – is especially well suited to 100% inspection. The technique can be adapted to smooth and rough surfaces, a range of field sizes and resolutions, and also the needed process speed.

Photonik I1/2009
Authors: Wolfgang Berggold, 3D-Shape GmbH, Erlangen, Germany

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